2009/05/26 by Ramón J. Peláez, Christophe Blondel, C. Delsart +1 · 7 citations
Physics and Astronomy · Materials Science · Chemistry · #Nuclear Physics and Applications #Electron and X-Ray Spectroscopy Techniques #Mass Spectrometry Techniques and Applications #Photoelectric effect #Electron microscope #Microscopy #Iodine #Ion #X-ray photoelectron spectroscopy #Materials science #Electron #Laser #Optics #Chemistry #Analytical Chemistry (journal) #Optoelectronics #Physics #Nuclear magnetic resonance
paper · doi:10.1088/0953-4075/42/12/125001
openalex publication_date 2009/05/26 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30
Photodetachment microscopy is carried out on a beam of 127 I − ions with a nanosecond pulsed laser. The photoelectron interferograms are recorded by means of a digital camera that images the light spots produced by the amplified photoelectrons on a phosphor screen. This is the first implementation of such an optical imaging technique in photodetachment microscopy. Due to their sensitivity to the photoelectron energy, the recorded electron interferograms can be quantitatively analysed to produce a measure of the electron affinity of iodine e A ( 127 I) with an accuracy improved by more than a factor of 2 with respect to the best previous measurement. The result is 2467 287.4(29) m −1 or 3.059 0463(38) eV.