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High precision measurement of the 32SH electron affinity by laser detachment microscopy

2006/06/03 by Walid Chaibi, Christian Delsart, C. Delsart +2 · 3 citations
Chemistry · Physics and Astronomy · #Analytical Chemistry (journal) #Atomic physics #Chemistry #Electron #Electron affinity (data page) #Electron microscope #Excitation #Ion #Ion laser #Laser #Laser-Matter Interactions and Applications #Materials science #Molecule #Optics #Physics #Spectroscopy and Laser Applications #Spectroscopy and Quantum Chemical Studies

paper · doi:10.1016/j.jms.2006.05.012

openalex publication_date 2006/06/03 · crossref created 2006/06/03 · crossref issued 2006/09/01 · crossref published 2006/09/01 · crossref published-print 2006/09/01 · crossref deposited 2025/09/19 · openalex created_date 2025/10/10 · crossref indexed 2026/01/02 · openalex updated_date 2026/07/29

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