Effect of a magnetic field in photodetachment microscopy

2010/04/13 by Walid Chaibi, W. Chaibi, Ramón J. Peláez +6 · 1 citation
Materials Science · Physics and Astronomy · #Advanced Chemical Physics Studies #Atomic physics #Computational physics #Computer science #Condensed matter physics #Electron #Electron and X-Ray Spectroscopy Techniques #Electron microscope #Interference (communication) #Magnetic field #Nuclear Physics and Applications #Optics #Physics #Quantum mechanics

paper · doi:10.1140/epjd/e2010-00086-7

crossref issued 2010/04/13 · crossref published 2010/04/13 · crossref published-online 2010/04/13 · openalex publication_date 2010/04/13 · crossref created 2010/04/13 · crossref published-print 2010/05/01 · crossref deposited 2019/11/04 · openalex created_date 2025/10/10 · crossref indexed 2026/02/08 · openalex updated_date 2026/07/23

Citations

• Electron dynamics in parallel electric and magnetic fields
• High precision measurement of the 32SH electron affinity by laser detachment microscopy
• Observed photodetachment in parallel electric and magnetic fields
• CODATA recommended values of the fundamental physical constants: 2010
• CODATA recommended values of the fundamental physical constants: 2006
• Electron spectrometry at the µeV level and the electron affinities of Si and F

Cited by

• Electron affinity (data page) [wikipedia]