2008/10/29 by L. J. Taskinen, R. P. Starrett, R.P. Starrett +7 · 12 citations
Engineering · Physics and Astronomy · #Advancements in Semiconductor Devices and Circuit Design #Bandwidth (computing) #Computer science #Electrical engineering #Electrical impedance #Electronic engineering #Engineering #Materials science #Optoelectronics #Physics #Quantum and electron transport phenomena #Reflectometry #Resistive touchscreen #Semiconductor materials and devices #Telecommunications #Time domain #Transformer #Transmission line #Voltage #cond-mat.mes-hall
paper · pdf · doi:10.1063/1.3030860
published in Review of Scientific Instruments 79(12), 123901 (American Institute of Physics) · 8 pages, 8 figures. Accepted for publication in Review of Scientific Instruments
arxiv created 2008/10/29 · openalex publication_date 2008/12/01 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
We have embedded an AlGaAs/GaAs based, gated two-dimensional (2D) hole system (2DHS) into an impedance transformer LC circuit and show that by using radio-frequency reflectometry it is possible to perform sensitive, large bandwidth, electrical resistance measurements of 2D systems at millikelvin temperatures. We construct a simple lumped element model where the gated 2DHS is described as a resistive transmission line. The model gives a qualitative understanding of the experimental results. As an example, we use our method to map out the Landau level evolution in a 2DHS as a function of magnetic field and gate voltage.