- Unambiguous determination of thickness and dielectric function of thin films by spectroscopic ellipsometry
1984/03/01 by H. Arwin, Hans Arwin, D. E. Aspnes +1 · 4 citations
Chemistry · Mathematics · Physics and Astronomy · #Analytical Chemistry (journal) #Chemistry #Composite material #Computational physics #Condensed matter physics #Critical point (mathematics) #Dielectric #Dielectric function #Electrochemical Analysis and Applications #Ellipsometry #Force Microscopy Techniques and Applications #Function (biology) #Geometry #Materials science #Mathematical analysis #Mathematics #Molecular physics #Monolayer #Nanotechnology #Optics #Optoelectronics #Physics #Point (geometry) #Range (aeronautics) #Sensitivity (control systems) #Spectroscopy and Quantum Chemical Studies #Substrate (aquarium) #Thin film