2002/11/04 by Andreas Käck, Andreas Kack, Göran Wendin +3
Computer Science · Engineering · Physics and Astronomy · #Amplifier #CMOS #Computer science #Electrical engineering #Engineering #Flicker noise #Materials science #Mechanical and Optical Resonators #Noise (video) #Noise figure #Optoelectronics #Physics #Quantum Information and Cryptography #Quantum and electron transport phenomena #Transistor #Voltage #cond-mat.mes-hall
paper · pdf · doi:10.1103/physrevb.67.035301
14 pages, 18 figures, submitted to PRB
arxiv created 2002/11/04 · openalex publication_date 2003/01/06 · arxiv updated 2015/06/24 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
We calculate the full-frequency spectral density of voltage fluctuations in a single-electron transistor (SET), used as an electrometer biased above the Coulomb threshold so that the current through the SET is carried by sequential tunneling events. We consider both a normal-state SET and a superconducting SET. The whole spectrum, from low-frequency telegraph noise to quantum noise at frequencies comparable to the SET charging energy (EC/\ensuremath\Elzxh) to high-frequency Nyquist noise, is described. We take the energy exchange between the SET and the measured system into account using a real-time diagrammatic Keldysh technique. The voltage fluctuations determine the backaction of the SET on the measured system, and we specifically discuss the case of superconducting charge qubit read-out and measuring the so-called Coulomb staircase of a single Cooper-pair box.