Defect Level as a Function of Fault Coverage

1981/12/01 by T.W. Williams, Williams, N.C. Brown +1
Computer Science · Engineering · #VLSI and Analog Circuit Testing #Integrated Circuits and Semiconductor Failure Analysis #Physical Unclonable Functions (PUFs) and Hardware Security

paper · doi:10.1109/tc.1981.1675742

Abstract

This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage with some assumptions. It is assumed that the faults occur randomly on the chips, which implies no clustering. This concept is extended to modules on boards.

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