Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures

2020/03/23 by Ömer Sevgili, Ömer Sevgi̇li̇, Yashar Azizian-Kalandaragh +3 · 1 citation
Engineering · Materials Science · Physics and Astronomy · #Dielectric properties of ceramics #Semiconductor materials and devices #Semiconductor materials and interfaces

paper · doi:10.1016/j.physb.2020.412122

openalex publication_date 2020/03/23 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30

Citations

• Physics of Semiconductor Devices

Cited by

• Dielectric properties of Ag/Si thin film prepared by ion-beam assisted deposition for energy storage applications