Quantitative measurement of displacement and strain fields from HREM micrographs

1998/08/01 by M.J. Hÿtch, Martin Hÿtch, E. Snoeck +1 · 10 citations
Computer Science · Physics and Astronomy · Engineering · #Optical measurement and interference techniques #Force Microscopy Techniques and Applications #Ultrasonics and Acoustic Wave Propagation

paper · doi:10.1016/s0304-3991(98)00035-7

Citations

• Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

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