The effect of scanning jitter on geometric phase analysis in STEM images

2018/07/30 by Jun Li, Shaobo Cheng, Lijun Wu +2
Biochemistry, Genetics and Molecular Biology · Physics and Astronomy · Materials Science · #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #Electron and X-Ray Spectroscopy Techniques

paper · doi:10.1016/j.ultramic.2018.07.011

Citations

• Quantitative measurement of displacement and strain fields from HREM micrographs
• Optimal and near‐optimal filters in high‐resolution electron microscopy
• Correcting nonlinear drift distortion of scanning probe and scanning transmission electron microscopies from image pairs with orthogonal scan directions