Quantitative Determination of Organic Semiconductor Microstructure from the Molecular to Device Scale

2012/08/09 by Jonathan Rivnay, Stefan C. B. Mannsfeld, Chad E. Miller +2 · 1,401 citations
Chemistry · Engineering · Physics and Astronomy · #Chemistry #Crystallography #Microstructure #Nanotechnology #Optoelectronics #Organic Electronics and Photovoltaics #Organic chemistry #Organic semiconductor #Scale (ratio) #Semiconductor #Semiconductor materials and interfaces #Thin-Film Transistor Technologies

paper · doi:10.1021/cr3001109

published in Chemical Reviews 112(10), 5488-5519 (American Chemical Society)

openalex publication_date 2012/08/09 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/30

Abstract

A study was conducted to demonstrate quantitative determination of organic semiconductor microstructure from the molecular to device scale. The quantitative determination of organic semiconductor microstructure from the molecular to device scale was key to obtaining precise description of the molecular structure and microstructure of the materials of interest. This information combined with electrical characterization and modeling allowed for the establishment of general design rules to guide future rational design of materials and devices. Investigations revealed that a number and variety of defects were the largest contributors to the existence of disorder within a lattice, as organic semiconductor crystals were dominated by weak van der Waals bonding. Crystallite size, texture, and variations in structure due to spatial confinement and interfaces were also found to be relevant for transport of free charge carriers and bound excitonic species over distances that were important for device operation.

Citations

• X-ray line broadening from filed aluminium and wolfram

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