S. Hembacher
- Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy
2000/07/21 by Franz J. Gießibl, S. Hembacher, H. Bielefeldt +1 · 6 citations
Physics and Astronomy · Engineering · #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #Advanced Materials Characterization Techniques
- Force Microscopy with Light-Atom Probes
2004/06/15 by S. Hembacher, Franz J. Gießibl, J. Mannhart · 4 citations
Physics and Astronomy · Engineering · #Force Microscopy Techniques and Applications #Advanced Materials Characterization Techniques #Surface and Thin Film Phenomena