Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy

2000/07/21 by Franz J. Gießibl, S. Hembacher, H. Bielefeldt +1 · 6 citations
Physics and Astronomy · Engineering · #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #Advanced Materials Characterization Techniques

paper · doi:10.1126/science.289.5478.422

openalex publication_date 2000/07/21 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/23

Abstract

The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range forces due to the formation of covalent bonds, the image of an individual atom should reflect the angular symmetry of the interaction. Here, we report on a distinct substructure in the images of individual adatoms on silicon (111)-(7x7), two crescents with a spherical envelope. The crescents are interpreted as images of two atomic orbitals of the front atom of the tip. Key for the observation of these subatomic features is a force-detection scheme with superior noise performance and enhanced sensitivity to short-range forces.

Citations

• Forces and frequency shifts in atomic-resolution dynamic-force microscopy
• Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Cited by

• Force Microscopy with Light-Atom Probes
• Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy
• The Force Needed to Move an Atom on a Surface
• The qPlus sensor, a powerful core for the atomic force microscope
• Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters
• Franz Josef Giessibl [wikipedia]