Tibor Grasser

1. The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps
   2011/10/05 by Tibor Grasser, Ben Kaczer, Wolfgang Goes +12 · 12 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Advanced Memory and Neural Computing
2. Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full V G, V D Bias Space: Implications and Peculiarities
   2020/06/23 by Markus Jech, G. Rott, Gunnar Rott +10 · 7 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Integrated Circuits and Semiconductor Failure Analysis
3. Efficient Quantum-Mechanical Modeling of Nonradiative Charge Transfer Processes
   2026/07/20 by Alexander Karl, Dominic Waldhoer, Theresia Knobloch +2
   #cond-mat.mtrl-sci #physics.app-ph