G. Rott

1. Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full V G, V D Bias Space: Implications and Peculiarities
   2020/06/23 by Markus Jech, G. Rott, Gunnar Rott +10 · 7 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Integrated Circuits and Semiconductor Failure Analysis