Katsuaki Nakazawa

1. Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector
   2020/05/19 by K. Nakazawa, Katsuaki Nakazawa, K. Mitsuishi +12 · 1 citation
   Biochemistry, Genetics and Molecular Biology · Engineering · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Ion-surface interactions and analysis #Materials Science (cond-mat.mtrl-sci) #cond-mat.mtrl-sci