D. Saha

1. On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress
   2006/06/21 by Souvik Mahapatra, S. Mahapatra, D. Saha +5 · 2 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Ferroelectric and Negative Capacitance Devices