Souvik Mahapatra

1. A Review of Hot Carrier Degradation in n-Channel MOSFETs—Part I: Physical Mechanism
   2020/05/25 by Souvik Mahapatra, Uma Sharma · 6 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Silicon Carbide Semiconductor Technologies
2. Disturb and its Mitigation in Ferroelectric Field-Effect Transistors With Large Memory Window for NAND Flash Applications
   2024/09/25 by Prasanna Venkatesan, Chinsung Park, Taeyoung Song +18 · 3 citations
   Computer Science · Engineering · #Advanced Data Storage Technologies #Ferroelectric and Negative Capacitance Devices #Semiconductor materials and devices
3. On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress
   2006/06/21 by Souvik Mahapatra, S. Mahapatra, Dipankar Saha +5 · 2 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Ferroelectric and Negative Capacitance Devices