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Paolo Magnone

  1. Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies
    2011/06/29 by Paolo Magnone, Felice Crupi, Nicole Wils +6 · 1 citation
    Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Electrostatic Discharge in Electronics