Alexander Grill

1. Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full V G, V D Bias Space: Implications and Peculiarities
   2020/06/23 by Markus Jech, Gunnar Rott, G. Rott +10 · 7 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Integrated Circuits and Semiconductor Failure Analysis
2. Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
   2023/01/06 by R. Asanovski, Ruben Asanovski, Alexander Grill +8 · 1 citation
   Engineering · Physics and Astronomy · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Quantum and electron transport phenomena