Zhuoqing Yu

1. Hot Carrier Degradation-Induced Dynamic Variability in FinFETs: Experiments and Modeling
   2020/03/05 by Zhuoqing Yu, Zixuan Sun, Runsheng Wang +2 · 6 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Ferroelectric and Negative Capacitance Devices