İlker Hamzaoğlu

1. Test set compaction algorithms for combinational circuits
   1998/01/01 by İlker Hamzaoğlu, J.H. Patel · 2 citations
   Computer Science · Engineering · #VLSI and Analog Circuit Testing #Low-power high-performance VLSI design #Integrated Circuits and Semiconductor Failure Analysis #Computer science #Algorithm #Citation #Combinational logic #Test (biology) #Center (category theory) #Research center #Library science #Logic gate