Y. Tanishiro
- Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy
1985/05/01 by K. Takayanagi, Y. Tanishiro, Masaetsu Takahashi +1 · 1,317 citations
Chemistry · Engineering · Physics and Astronomy · #Chemistry #Crystallography #Diffraction #Dislocation #Electron diffraction #Electron microscope #Integrated Circuits and Semiconductor Failure Analysis #Materials science #Molecular physics #Nanotechnology #Optics #Physics #Reflection high-energy electron diffraction #Silicon Carbide Semiconductor Technologies #Stacking #Stacking fault #Surface and Thin Film Phenomena #Transmission electron microscopy