Jaan Aarik

1. Characterization of asymmetric rhombohedral twin in epitaxial α-Cr2O3 thin films by X-ray and electron diffraction
   2006/12/29 by Hugo Mändar, Teet Uustare, Jaan Aarik +3 · 1 citation
   Materials Science · #Corrosion Behavior and Inhibition #X-ray Diffraction in Crystallography #Copper-based nanomaterials and applications