Characterization of asymmetric rhombohedral twin in epitaxial α-Cr2O3 thin films by X-ray and electron diffraction

2006/12/29 by Hugo Mändar, Teet Uustare, Jaan Aarik +3 · 1 citation
Chemistry · Materials Science · #Analytical Chemistry (journal) #Chemistry #Copper-based nanomaterials and applications #Corrosion Behavior and Inhibition #Crystallography #Diffraction #Electron diffraction #Epitaxy #Layer (electronics) #Materials science #Nanotechnology #Optics #Physics #Reflection (computer programming) #Reflection high-energy electron diffraction #Thin film #X-ray Diffraction in Crystallography #X-ray reflectivity

paper · doi:10.1016/j.tsf.2006.11.037

openalex publication_date 2006/12/29 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

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