- Flash electropolishing for TEM: Reducing FIB‐induced defects in tungsten with protocols for new materials #
2026/05/23 by Yan‐Ru Lin, Yan-Ru Lin, Weicheng Zhong +7 · 1 voice
Biochemistry, Genetics and Molecular Biology · Engineering · Materials Science · #Advanced Electron Microscopy Techniques and Applications #Electropolishing #Flash (photography) #Focused ion beam #Fusion materials and technologies #Ion-surface interactions and analysis #Polishing #Transmission electron microscopy #Tungsten