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Finite Sample Analysis for a Class of Subspace Identification Methods

2024/04/26 by Jiabao He, Ingvar Ziemann, He, Jiabao +5
Decision Sciences · Engineering · #Control Systems and Identification #FOS: Electrical engineering #Probabilistic and Robust Engineering Design #Structural Health Monitoring Techniques #Systems and Control (eess.SY) #electronic engineering #information engineering

paper · pdf · doi:10.48550/arxiv.2404.17331

openalex publication_date 2024/04/26 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

While subspace identification methods (SIMs) are appealing due to their simple parameterization for MIMO systems and robust numerical realizations, a comprehensive statistical analysis of SIMs remains an open problem, especially in the non-asymptotic regime. In this work, we provide a finite sample analysis for a class of SIMs, which reveals that the convergence rates for estimating Markov parameters and system matrices are O(1/√(N)), in line with classical asymptotic results. Based on the observation that the model format in classical SIMs becomes non-causal because of a projection step, we choose a parsimonious SIM that bypasses the projection step and strictly enforces a causal model to facilitate the analysis, where a bank of ARX models are estimated in parallel. Leveraging recent results from finite sample analysis of an individual ARX model, we obtain an overall error bound of an array of ARX models and proceed to derive error bounds for system matrices via robustness results for the singular value decomposition.

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