1993/07/01 by Jeffrey L. Hutter, John Bechhoefer · 7 citations
Physics and Astronomy · Engineering · #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #Near-Field Optical Microscopy
paper · doi:10.1063/1.1143970
Images and force measurements taken by an atomic-force microscope (AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure uses the AFM itself and does not require additional equipment.