2005/01/12 by Robert W. Stark, Stark, Robert W.
Physics and Astronomy · #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #physics.ins-det
paper · pdf · doi:10.48550/arxiv.physics/0501061
5 pages, 3 figures First International Meeting on Applied Physics (aphys2003), 2003, Badajoz, Spain
arxiv created 2005/01/12 · arxiv updated 2009/12/01
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a correct interpretation data acquired by dynamic AFM. Here, the system response in tapping-mode atomic force microscope (AFM) simulated numerically. In the computer model the AFM microcantilever is treated as a distributed parameter system. With this multiple-degree-of-freedom (MDOF) approach the the total harmonic distortion in dynamic AFM spectroscopy is simulated.