2015/03/16 by Nan Li, Li, Nan, Gunnar Carlsson +6 · 1 citation
Computer Science · Engineering · #FOS: Computer and information sciences #Hardware Architecture (cs.AR) #Integrated Circuits and Semiconductor Failure Analysis #Physical Unclonable Functions (PUFs) and Hardware Security #VLSI and Analog Circuit Testing #cs.AR
paper · pdf · doi:10.48550/arxiv.1503.04628
6 pages, 3 figures
arxiv created 2015/03/16 · openalex publication_date 2015/03/16 · arxiv updated 2015/03/17 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
Many believe that in-field hardware faults are too rare in practice to justify the need for Logic Built-In Self-Test (LBIST) in a design. Until now, LBIST was primarily used in safety-critical applications. However, this may change soon. First, even if costly methods like burn-in are applied, it is no longer possible to get rid of all latent defects in devices at leading-edge technology. Second, demands for high reliability spread to consumer electronics as smartphones replace our wallets and IDs. However, today many ASIC vendors are reluctant to use LBIST. In this paper, we describe the needs for successful deployment of LBIST in the industrial practice and discuss how these needs can be addressed. Our work is hoped to attract a wider attention to this important research topic.