2017/12/27 by Sachenko, A. V., V. P. Kostylyov, A. V. Bobyl +14
Engineering · #Applied Physics (physics.app-ph) #FOS: Physical sciences #Silicon and Solar Cell Technologies
paper · pdf · doi:10.48550/arxiv.1712.09611
openalex publication_date 2017/12/27 · openalex created_date 2018/01/05 · openalex updated_date 2026/07/28
The transformation of the long-wavelength edge of the external quantum exit (EQE) formation mechanisms in textured silicon solar cells (SCs) is revealed, depending on their thickness. Expressions for experimental EQE dependences on the long-wavelength absorption edge are obtained for a wide range of base thicknesses (100-450 μm). The expressions allow optimal SC base thickness values calculation from the condition of maximal photoconversion efficiency taking into account surface recombination velocity. In particular, it was found that optimal 100-μm base thickness corresponds to the surface recombination velocity of about 3 cm/s.