2020/11/13 by Jake Sheriff, J. Sheriff, I. W. Fletcher +5
Biochemistry, Genetics and Molecular Biology · Engineering · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Ion-surface interactions and analysis #Materials Science (cond-mat.mtrl-sci) #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.2011.14949
arxiv created 2020/11/13 · openalex publication_date 2020/11/13 · arxiv updated 2020/12/01 · openalex created_date 2020/12/07 · openalex updated_date 2026/07/28
We present a newly developed methodology using computer-readable fiducial markers to allow images from multiple imaging modalities to be registered automatically. This methodology makes it possible to correlate images from many surface imaging techniques to provide an unprecedented level of surface detail on a nanometre scale that no one technique can provide alone. This methodology provides the capability to navigate to specific areas of interest when transferring samples from machine to machine seamlessly. Then taking data acquired from Scanning Electron Microscope (SEM), Secondary Ion Mass Spectrometry (SIMS), x-ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM) and optical inspection tools and combining all the data acquired to then generate a 3D data representative model of a surface.