2017/12/07 by Marcin Copik, Copik, Marcin
Biochemistry, Genetics and Molecular Biology · Computer Science · Engineering · Materials Science · #Advanced Electron Microscopy Techniques and Applications #Advancements in Photolithography Techniques #Digital Image Processing Techniques #Distributed #Electron and X-Ray Spectroscopy Techniques #FOS: Computer and information sciences #Parallel #and Cluster Computing (cs.DC) #cs.DC
paper · pdf · doi:10.48550/arxiv.1712.02533
Master Thesis
arxiv created 2017/12/07 · openalex publication_date 2017/12/07 · arxiv updated 2017/12/08 · openalex created_date 2022/10/01 · openalex updated_date 2026/07/28
Recent advances in the technology of transmission electron microscopy have allowed for a more precise visualization of materials and physical processes, such as metal oxidation. Nevertheless, the quality of information is limited by the damage caused by an electron beam, movement of the specimen or other environmental factors. A novel registration method has been proposed to remove those limitations by acquiring a series of low dose microscopy frames and performing a computational registration on them to understand and visualize the sample. This process can be represented as a prefix sum with a complex and computationally intensive binary operator and a parallelization is necessary to enable processing long series of microscopy images. With our parallelization scheme, the time of registration of results from ten seconds of microscopy acquisition has been decreased from almost thirteen hours to less than seven minutes on 512 Intel IvyBridge cores.