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Yield and performance validation of the Monolithic Stitched Sensor (MOSS), the first wafer-scale prototype for the ALICE ITS3 upgrade

2025/11/04 by Menzel, Marius Wilm
Engineering · Physics and Astronomy · #CCD and CMOS Imaging Sensors #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Particle Detector Development and Performance #Radiation Detection and Scintillator Technologies

paper · pdf · doi:10.48550/arxiv.2511.02403

openalex publication_date 2025/11/04 · openalex created_date 2025/11/06 · openalex updated_date 2026/07/28

Abstract

The ALICE Inner Tracking System upgrade (ITS3) will employ stitched, wafer-scale Monolithic Active Pixel Sensors (MAPS) for the first time in high-energy physics, achieving a material budget of only 0.09 % X\mathrm0 per layer. Its first stitched prototype, the Monolithic Stitched Sensor (MOSS), underwent serial testing confirming sensor yield compliance with ITS3 requirements. In-beam tests show the device meets the ITS3 efficiency requirement of > 99 % while maintaining a fake-hit rate below 0.1 hits/pixel/s, with performance sustained up to irradiation levels of 4 kGy and 4×10121MeV n\mathrmeq cm\mathrm-2. The sensor demonstrates excellent charge-collection properties and linearity between time-over-threshold and deposited energy in the 1.8 - 6.5 keV range in response to soft X-ray emissions. This article provides an overview of the validation steps and characterisation results.

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