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High-fidelity dispersive spin sensing in a tuneable unit cell of silicon MOS quantum dots

2025/05/15 by C. Lainé, Lainé, Constance, Giovanni A. Oakes +21 · 2 citations
Materials Science · Physics and Astronomy · #FOS: Physical sciences #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Quantum Physics (quant-ph) #Quantum and electron transport phenomena #Semiconductor Quantum Structures and Devices #Silicon Nanostructures and Photoluminescence

paper · pdf · doi:10.48550/arxiv.2505.10435

openalex publication_date 2025/05/15 · openalex created_date 2025/10/15 · openalex updated_date 2026/07/30

Abstract

Metal-oxide-semiconductor (MOS) technology is a promising platform for developing quantum computers based on spin qubits. Scaling this approach will benefit from compact and sensitive sensors that minimize constraints on qubit connectivity while being industrially manufacturable. Here, we demonstrate a compact dispersive spin-qubit sensor, a single-electron box (SEB), within a bilinear unit cell of planar MOS quantum dots (QDs) fabricated using an industrial grade 300 mm wafer process. By independent gate control of the SEB and double-quantum-dot tunnel rates, we optimize the sensor to achieve a readout fidelity of 99.92% in 340us (99% in 20us), fidelity values on a par with the best obtained with less compact sensors. Furthermore, we develop a Hidden Markov Model of the two-electron spin dynamics that enables a more accurate calculation of the measurement outcome and hence readout fidelity. Our results show how high-fidelity sensors can be introduced within silicon spin-qubit architectures while maintaining sufficient qubit connectivity as well as providing faster readout and more efficient initialisation schemes.

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