Calculation of RF-induced Temporal Jitter in Ultrafast Electron Diffraction

2024/08/01 by T. Xu, Xu, Tianzhe, Fuhao Ji +5 · 1 citation
Engineering · Physics and Astronomy · #Accelerator Physics (physics.acc-ph) #Crystallography and Radiation Phenomena #FOS: Physical sciences #Gyrotron and Vacuum Electronics Research #Terahertz technology and applications

paper · pdf · doi:10.48550/arxiv.2408.00937

openalex publication_date 2024/08/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01

Abstract

A significant contribution to the temporal resolution of an ultrafast electron diffraction (UED) instrument is arrival time jitter caused by amplitude and phase variation of radio frequency (RF) cavities. In this paper, we present a semi-analytical approach for calculating RF-induced temporal jitter from klystron and RF cavity parameters. Our approach allows fast estimation of temporal jitter for MeV-UED beamlines and can serve as a virtual timing tool when shot-to-shot measurements of RF amplitude and phase jitters are available. A simulation study for the SLAC MeV-UED instrument is presented and the temporal resolution for several beamline configurations are compared.

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