2015/10/21 by Guanglei Wang, Wang, Guanglei, Meng Zhang +7
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Accelerator Physics (physics.acc-ph) #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences
paper · pdf · doi:10.48550/arxiv.1510.06111
openalex publication_date 2015/10/21 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
In modern high-gain free-electron lasers, ultra-fast photon pulses designed for studying chemical, atomic and biological systems are generated from a serial of behaviors of high-brightness electron beam at the time-scale ranging from several hundred femtoseconds to sub-femtosecond. Currently, radiofrequency transverse deflectors are widely used to provide reliable, single-shot electron beam phase space diagnostics, with a temporal resolution of femtosecond. Here, we show that the time resolution limitations caused by the intrinsic beam size in transverse deflectors, can be compensated with specific transverse-to-longitudinal coupling elements. For the purpose, an undulator with transverse gradient field is introduced before the transverse deflector. With this technique, a resolution of less than 1fs root mean square has been theoretically demonstrated for measuring the longitudinal profile and/or the micro-bunching of the electron bunch.