2020/01/13 by Ondrej Dyck, Cheng Zhang, Philip D. Rack +6
Biochemistry, Genetics and Molecular Biology · Chemistry · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Atom (system on chip) #Chemical physics #Chemistry #Covalent bond #Dopant #Doping #Electron and X-Ray Spectroscopy Techniques #Graphene #Graphene research and applications #Ion #Ionic bonding #Materials science #Molecular physics #Nanotechnology #Optoelectronics #Organic chemistry #cond-mat.mtrl-sci
paper · pdf · doi:10.1016/j.carbon.2020.01.042
published as Carbon 161, 750-757 (2020) · 23 pages, 6 figures
openalex publication_date 2020/01/13 · arxiv created 2022/03/17 · arxiv updated 2022/03/18 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/06
Electron-beam (e-beam) manipulation of single dopant atoms in an aberration-corrected scanning transmission electron microscope is emerging as a method for directed atomic motion and atom-by-atom assembly. Until now, the dopant species have been limited to atoms closely matched to carbon in terms of ionic radius and capable of strong covalent bonding with carbon atoms in the graphene lattice. In situ dopant insertion into a graphene lattice has thus far been demonstrated only for Si, which is ubiquitously present as a contaminant in this material. Here, we achieve in situ manipulation of Pt atoms and their insertion into the graphene host matrix using the e-beam deposited Pt on graphene as a host system. We further demonstrate a mechanism for stabilization of the Pt atom, enabled through the formation of Si-stabilized Pt heteroatomic clusters attached to the graphene surface. This study provides evidence toward the universality of the e-beam assembly approach, opening a pathway for exploring cluster chemistry through direct assembly.