1990/09/24 by Peter M. Levy, Shufeng Zhang, A. Fert · 3 citations
Physics and Astronomy · Materials Science · #Magnetic properties of thin films #Copper Interconnects and Reliability #Theoretical and Computational Physics #Electrical resistivity and conductivity #Scattering #Condensed matter physics #Magnetoresistance #Materials science #Superlattice #Magnetization #Giant magnetoresistance #Conductivity #Magnetic field #Optics #Physics
paper · doi:10.1103/physrevlett.65.1643
openalex publication_date 1990/09/24 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/02
The electrical-transport properties of magnetic multilayered structures are dominated by three ingredients: (1) the scattering within layers that changes from one layer to another, (2) the additional scattering resistivity due to the roughness of the interfaces between layers, and (3) the resistivity that depends on the orientation of the magnetization of the magnetic layers. In the quasiclassical approach the boundary scattering is treated differently from other sources. Here we present a unified treatment of all sources of resistivity, and determine the origin of the giant magnetoresistance observed in Fe/Cr superlattices.