1952/01/01 by E.H. Sondheimer, E. H. Sondheimer · 37 citations
Materials Science · Engineering · #Copper Interconnects and Reliability #Corrosion Behavior and Inhibition #Semiconductor materials and devices
paper · doi:10.1080/00018735200101151
Click to increase image sizeClick to decrease image size Additional informationNotes on contributorsE.H. Sondheimer Now at the Department of Mathematics, Imperial College, London.