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Micro-reflectance and transmittance spectroscopy: a versatile and powerful tool to characterize 2D materials

2016/12/13 by Riccardo Frisenda, Yue Niu, Patricia Gant +10 · 1 citation
Materials Science · Physics and Astronomy · #2D Materials and Applications #Characterization (materials science) #Graphene research and applications #Optical materials #Photoluminescence #Raman spectroscopy #Reflectivity #Spectroscopy #Strong Light-Matter Interactions #Transmittance #cond-mat.mes-hall #cond-mat.mtrl-sci #physics.ins-det

paper · pdf · doi:10.1088/1361-6463/aa5256

5 main text figures + 1 table with all the part numbers to replicate the experimental setup + 4 supp. info. figures

arxiv created 2016/12/13 · openalex created_date 2017/01/06 · openalex publication_date 2017/01/23 · arxiv updated 2017/03/08 · openalex updated_date 2026/08/06

Abstract

Abstract Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ~1 µ m in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.

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