2007/05/31 by P. Blake, K. S. Novoselov, A. H. Castro Neto +5 · 9 citations
Engineering · Materials Science · Physics and Astronomy · #Graphene and Nanomaterials Applications #Graphene research and applications #Plasmonic and Surface Plasmon Research #cond-mat.mes-hall #cond-mat.other
paper · pdf · doi:10.1063/1.2768624
published as Appl. Phys. Lett. 91, 063124 (2007) · Since v1: minor changes to text and figures to improve clarity; references added. Submitted to Applied Physics Letters, 30-Apr-07. 3 pages, 3 figures
openalex publication_date 2007/08/06 · arxiv created 2007/09/22 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28
Microfabrication of graphene devices used in many experimental studies currently relies on the fact that graphene crystallites can be visualized using optical microscopy if prepared on top of Si wafers with a certain thickness of SiO2. The authors study graphene’s visibility and show that it depends strongly on both thickness of SiO2 and light wavelength. They have found that by using monochromatic illumination, graphene can be isolated for any SiO2 thickness, albeit 300nm (the current standard) and, especially, ≈100nm are most suitable for its visual detection. By using a Fresnel-law-based model, they quantitatively describe the experimental data.