2015/09/22 by Armand Béché, Bart Goris, Bert Freitag +2 · 65 citations
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Artificial intelligence #Beam (structure) #Cathode ray #Compressed sensing #Computer science #Condenser (optics) #Conventional transmission electron microscope #Electron #Materials science #Nanopore and Nanochannel Transport Studies #Near-Field Optical Microscopy #Optics #Physics #Scanning confocal electron microscopy #Scanning electron microscope #Scanning transmission electron microscopy #Shutter #physics.ins-det
paper · pdf · doi:10.1063/1.4943086
published in Applied Physics Letters 108(9) (American Institute of Physics) · 7 pages, 5 figures
arxiv created 2015/09/22 · openalex publication_date 2016/02/29 · arxiv updated 2016/03/23 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
The concept of compressed sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based on an electromagnetic beam blanker placed in the condenser plane of a STEM is proposed. The beam blanker deflects the beam with a random pattern, while the scanning coils are moving the beam in the usual scan pattern. Experimental images at both the medium scale and high resolution are acquired and reconstructed based on a discrete cosine algorithm. The obtained results confirm that compressed sensing is highly attractive to limit beam damage in experimental STEM even though some remaining artifacts need to be resolved.