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Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width

2007/02/10 by A. Sarkar, Sarkar, A., P. Mukherjee +3
Physics and Astronomy · #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #cond-mat.mtrl-sci

paper · pdf · doi:10.48550/arxiv.cond-mat/0702262

Presented at European Powder Diffraction Conference (EPDIC 10), Geneva

arxiv created 2007/02/10 · arxiv updated 2009/12/01

Abstract

The anisotropic broadening of ZrSiO4 sample is modelled using the Stephens's phenomenological model for anisotropic line broadening and the three dimensional strain distribution in the sample is plotted. The micro-structural parameters like domain size and dislocation density are estimated using the variance method.

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