2007/01/26 by A. Sarkar, Sarkar, A., P. Mukherjee +3
Materials Science · Physics and Astronomy · #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Microstructure and mechanical properties #Nuclear Materials and Properties #X-ray Diffraction in Crystallography #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.cond-mat/0701645
arxiv created 2007/01/26 · openalex publication_date 2007/01/26 · arxiv updated 2009/12/01 · openalex created_date 2019/06/27 · openalex updated_date 2026/07/28
The diffraction peaks of Zircaloy-2 and Zr-2.5%Nb alloys at various deformations are found to be asymmetric in nature. In order to characterize the microstructure from these asymmetric peaks of these deformed alloys, X-Ray Diffraction Line Profile Analysis like Williamson-Hall technique, Variance method based on second and fourth order restricted moments and Stephens model based on anisotropic strain distribution have been adopted. The domain size and dislocation density have been evaluated as a function of deformation for both these alloys. These techniques are useful where the dislocation structure is highly inhomogeneous inside the matrix causing asymmetry in the line profile, particularly for deformed polycrystalline materials.