1965/08/06 by Erwin W. Müller · 1 citation
Engineering · Physics and Astronomy · Materials Science · #Advanced Materials Characterization Techniques #Force Microscopy Techniques and Applications #Diamond and Carbon-based Materials Research
paper · doi:10.1126/science.149.3684.591
openalex publication_date 1965/08/06 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/23
Abstract : The basic physical effects used in field ion microscopy are not yet fully understood. Field evaporation rates of tungsten were measured in the range from 0.01 to 10,000,000 atomic layers/sec, yielding the polarizability of a kink site surface atom, the activation energy and the pre-exponential of the field evaporation equation. Using the polarizability, the dipole-dipole binding energy of field-adsorbed noble gases ahs been calculated, and a modified mechanism of field ionization and image interpretation is proposed. A high-voltage field ion microscope has been operated at up to 45 kV, giving an increased field of view.