1956/05/01 by Erwin W. Müller, Kanwar Bahadur · 8 citations
Engineering · Physics and Astronomy · #Advanced Materials Characterization Techniques #Force Microscopy Techniques and Applications #Ion-surface interactions and analysis
paper · doi:10.1103/physrev.102.624
openalex publication_date 1956/05/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/17
The mechanism of field emission of positive ions is considered as depending upon the supply of molecules and their ionization probability in a field up to 500 million volts/cm. Experimental current-field characteristics match the theoretical curves. The velocity distribution, measured in a retarding potential tube, shows that the ions originate some 5 to 100 A above the surface, depending upon the field. A simple mass spectrometer is described which uses the field emitter as a point ion source. The resolution of the field ion microscope is found to depend upon tip radius, polarizability and ionization potential of the gas, and possibly upon the accommodation coefficient and the temperature. Helium seems to give the best resolution of about 4 A. The possibility of operating a field desorption microscope with sufficient resolution to show the lattice structure of the surface is discussed.