Identifying single electron charge sensor events using wavelet edge detection

2015/05/01 by J. R. Prance, J R Prance, B J Van Bael +12
Biochemistry, Genetics and Molecular Biology · Computer Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Charge-coupled device #Detection theory #Edge detection #Enhanced Data Rates for GSM Evolution #Noise (video) #Quantum and electron transport phenomena #Quantum-Dot Cellular Automata #SIGNAL (programming language) #Thresholding #Wavelet #cond-mat.mes-hall

paper · pdf · doi:10.1088/0957-4484/26/21/215201

published as Nanotechnology 26, 215201 (2015) · 11 pages, 4 figures

openalex publication_date 2015/05/01 · arxiv created 2015/06/07 · arxiv updated 2015/06/09 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05

Abstract

The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common detection scheme, comparing the signal to a threshold value, is accurate at low noise levels but is not robust to low-frequency noise and signal drift. We describe an alternative method for identifying charge sensor events using wavelet edge detection. The technique is convenient to use and we show that, with realistic signals and a single tunable parameter, wavelet detection can outperform thresholding and is significantly more tolerant to 1/f and low-frequency noise.

Citations

• Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot
• Single-shot measurement of the Josephson charge qubit
• Coherent Manipulation of Coupled Electron Spins in Semiconductor Quantum Dots
• Identification and analysis of functional elements in 1% of the human genome by the ENCODE pilot project
• A Computational Approach to Edge Detection
• Single-shot read-out of an individual electron spin in a quantum dot
• Quantum Computing