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Retrieval of depth profile of nano-scale thin films by one directional polarization analysis in neutron specular reflectometry

2011/04/15 by S. Farhad Masoudi, Saeed S. Jahromi
Chemistry · Earth and Planetary Sciences · Physics and Astronomy · #Atomic and Subatomic Physics Research #Chemistry #Computer science #High-pressure geophysics and materials #Laser beam quality #Laser beams #Materials science #Neutron #Neutron radiation #Neutron reflectometry #Neutron scattering #Nuclear Physics and Applications #Nuclear physics #Optics #Physics #Polarization (electrochemistry) #Radial polarization #Reflection coefficient #Reflectometry #Scattering #Small-angle neutron scattering #Specular reflection #Time domain #cond-mat.mtrl-sci

paper · pdf · doi:10.1016/j.physb.2011.03.070

published as Physica B 406 (2011) 2570-2573 · 5 pages, 6 figures

openalex publication_date 2011/04/15 · arxiv created 2011/08/29 · arxiv updated 2015/05/29 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05

Abstract

Recently it has been shown that the modules and phase of complex reflection coefficient can be determined by using a magnetic substrate and polarized neutrons. Several other methods have also been worked out based on measurement of polarizations of reflected neutrons from magnetic reference layers and magnetic substrate. However, due to the fact that available reflectometers are limited in the choice of polarization of reflected beam in the same direction as the polarization of the incident beam, neither of the methods which are based on polarization analysis, has been proven to be experimentally practical. In this paper, we have proposed a new method for determining the phase of reflection coefficient which is based on two measurements of polarization which correspond to two magnetic fields with the same magnitudes and different orientations. The polarization analysis is performed in the same direction as the polarization of the incident beam and is well suited for available reflectometers. The problems envisaged in implementation of the method are also discussed.

Citations