2004/10/03 by S. Farhad Masoudi, Ali Pazirandeh · 1 citation
Earth and Planetary Sciences · Physics and Astronomy · #High-pressure geophysics and materials #Magnetic properties of thin films #Nuclear Physics and Applications #cond-mat.mtrl-sci
paper · pdf · doi:10.1016/j.physb.2005.02.005
1 PDF file
arxiv created 2004/10/03 · openalex publication_date 2005/03/16 · arxiv updated 2009/12/01 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28
The scattering length density profile for a thin film structure can be determined uniquely if both modulus and phase of the reflection coefficient is known. Here, we describe a method for recovering the phase information which utilize a magnetic substrate and based on polarization analysis of the reflected beam. The method is derived in the formalism of transfer matrix so it is applicable for any unknown real scattering length density of nonmagnetic films (i.e. in the case where there is no effective absorption).